Mechanism of Threshold Voltage Instability in Double Gate α-IGZO Nanosheet TFT under Bias and Temperature Stress

Muhammad Aslam, Shu Wei Chang, Yi Ho Chen, Yao Jen Lee*, Yiming Li, Wen Hsi Lee

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

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Engineering

Material Science

Earth and Planetary Sciences

Chemical Engineering