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Measuring the edge recombination velocity of monolayer semiconductors
Peida Zhao, Matin Amani, Der Hsien Lien, Geun Ho Ahn, Daisuke Kiriya, James P. Mastandrea, Joel W. Ager, Eli Yablonovitch, Daryl C. Chrzan, Ali Javey
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review