Measuring the deflection of the cantilever in atomic force microscope with an optical pickup system

Keyphrases

• Atomic Force Microscope 100%
• Deflection 100%
• Optical pickup 100%
• Cantilever 100%
• Microscopy System 33%
• Tapping Mode 33%
• Detection System 33%
• Piezoelectric Actuator 33%
• Optical pickup Head 33%
• Quadrant Photodiode 33%
• Sensor Systems 33%
• Sensibility 33%
• Step Height 33%
• Temperature Variation 33%
• Four-quadrant 33%
• Hardware Structure 33%
• Read Only Memory 33%
• Digital Versatile Disc 33%
• Calibration Grating 33%
• Vertical Resolution 33%
• Optical Sensor System 33%
• Optical Lever 33%

Engineering

• Atomic Force Microscope 100%
• Sensor System 66%
• Tapping Mode 33%
• Photodiode 33%
• Temperature Change 33%
• Optical Sensors 33%