Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee; Judy J. Cha; Sara C. Barron; David A. Muller; R. Bruce Van Dover; Ebenezer K. Amponsah; Tuo-Hung Hou; Hassan Raza; Edwin C. Kan

doi:10.1109/SOI.2008.4656284

Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee^*, Judy J. Cha, Sara C. Barron, David A. Muller, R. Bruce Van Dover, Ebenezer K. Amponsah, Tuo-Hung Hou, Hassan Raza, Edwin C. Kan

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Scopus citations

Original language	English
Title of host publication	2008 IEEE International SOI Conference Proceedings
Pages	39-40
Number of pages	2
DOIs	https://doi.org/10.1109/SOI.2008.4656284
State	Published - 2008
Event	2008 IEEE International SOI Conference - New Paltz, NY, United States Duration: 6 Oct 2008 → 9 Oct 2008

Publication series

Name	Proceedings - IEEE International SOI Conference
ISSN (Print)	1078-621X

Conference

Conference	2008 IEEE International SOI Conference
Country/Territory	United States
City	New Paltz, NY
Period	6/10/08 → 9/10/08

Access to Document

10.1109/SOI.2008.4656284

Cite this

Lee, J., Cha, J. J., Barron, S. C., Muller, D. A., Van Dover, R. B., Amponsah, E. K., Hou, T.-H., Raza, H., & Kan, E. C. (2008). Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. In 2008 IEEE International SOI Conference Proceedings (pp. 39-40). Article 4656284 (Proceedings - IEEE International SOI Conference). https://doi.org/10.1109/SOI.2008.4656284

@inproceedings{e396e938bb1a4c1b91a3bab8fb0da5d0,

title = "Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics",

author = "Jaegoo Lee and Cha, {Judy J.} and Barron, {Sara C.} and Muller, {David A.} and {Van Dover}, {R. Bruce} and Amponsah, {Ebenezer K.} and Tuo-Hung Hou and Hassan Raza and Kan, {Edwin C.}",

year = "2008",

doi = "10.1109/SOI.2008.4656284",

language = "English",

isbn = "9781424419548",

series = "Proceedings - IEEE International SOI Conference",

pages = "39--40",

booktitle = "2008 IEEE International SOI Conference Proceedings",

note = "2008 IEEE International SOI Conference ; Conference date: 06-10-2008 Through 09-10-2008",

}

Lee, J, Cha, JJ, Barron, SC, Muller, DA, Van Dover, RB, Amponsah, EK, Hou, T-H, Raza, H & Kan, EC 2008, Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. in 2008 IEEE International SOI Conference Proceedings., 4656284, Proceedings - IEEE International SOI Conference, pp. 39-40, 2008 IEEE International SOI Conference, New Paltz, NY, United States, 6/10/08. https://doi.org/10.1109/SOI.2008.4656284

Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. / Lee, Jaegoo; Cha, Judy J.; Barron, Sara C. et al.
2008 IEEE International SOI Conference Proceedings. 2008. p. 39-40 4656284 (Proceedings - IEEE International SOI Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

AU - Lee, Jaegoo

AU - Cha, Judy J.

AU - Barron, Sara C.

AU - Muller, David A.

AU - Van Dover, R. Bruce

AU - Amponsah, Ebenezer K.

AU - Hou, Tuo-Hung

AU - Raza, Hassan

AU - Kan, Edwin C.

PY - 2008

Y1 - 2008

UR - http://www.scopus.com/inward/record.url?scp=57749184570&partnerID=8YFLogxK

U2 - 10.1109/SOI.2008.4656284

DO - 10.1109/SOI.2008.4656284

M3 - Conference contribution

AN - SCOPUS:57749184570

SN - 9781424419548

T3 - Proceedings - IEEE International SOI Conference

SP - 39

EP - 40

BT - 2008 IEEE International SOI Conference Proceedings

T2 - 2008 IEEE International SOI Conference

Y2 - 6 October 2008 through 9 October 2008

ER -

Lee J, Cha JJ, Barron SC, Muller DA, Van Dover RB, Amponsah EK et al. Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics. In 2008 IEEE International SOI Conference Proceedings. 2008. p. 39-40. 4656284. (Proceedings - IEEE International SOI Conference). doi: 10.1109/SOI.2008.4656284

Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Publication series

Conference

Access to Document

Other files and links

Cite this