Material and electrical characterization of stackable planar polysilicon TFT flash memory cell with metal nanocrystals and high-k dielectrics

Jaegoo Lee*, Judy J. Cha, Sara C. Barron, David A. Muller, R. Bruce Van Dover, Ebenezer K. Amponsah, Tuo-Hung Hou, Hassan Raza, Edwin C. Kan

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    2 Scopus citations
    Original languageEnglish
    Title of host publication2008 IEEE International SOI Conference Proceedings
    Number of pages2
    StatePublished - 24 Dec 2008
    Event2008 IEEE International SOI Conference - New Paltz, NY, United States
    Duration: 6 Oct 20089 Oct 2008

    Publication series

    NameProceedings - IEEE International SOI Conference
    ISSN (Print)1078-621X


    Conference2008 IEEE International SOI Conference
    Country/TerritoryUnited States
    CityNew Paltz, NY

    Cite this