Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy

J. C. Chen*, C. Y. Lo, S. L. Huang, F. J. Kao

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

We have demonstrated the use of confocal fluorescent microscopy in mapping the Cr+3 profile with in the YAG crystal fiber. Asensitivityof 1.0×1017/cm3 was achieved, which is more than an order of magnitude better than that of electron probe micro-analysis.

Original languageEnglish
Pages (from-to)1357-1358
Number of pages2
JournalOSA Trends in Optics and Photonics Series
Volume88
StatePublished - Jun 2003
EventConference on Lasers and Electro-Optics (CLEO); Postconference Digest - Baltimore, MD, United States
Duration: 1 Jun 20036 Jun 2003

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