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Magnetic depth profiling Co/Cu multilayers to investigate magnetoresistance (invited)
J. Unguris*, D. Tulchinsky, M. H. Kelley, J. A. Borchers, J. A. Dura, C. F. Majkrzak, Shih-ying Hsu, R. Loloee, W. P. Pratt, J. Bass
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
7
Scopus
citations