Machine Learning Approach to Characteristic Fluctuation of Bulk FinFETs Induced by Random Interface Traps

Keyphrases

• Fin Field-effect Transistor (FinFET) 100%
• Interface Traps 100%
• Machine Learning Approach 100%
• Characteristic Fluctuation 100%
• Random Interface Trap 100%
• Device Characteristics 50%
• Machine Learning Models 50%
• Subthreshold Slope 25%
• Metal Gate 25%
• Off-state Current 25%
• Transconductance 25%
• Adverse Effects 25%
• Computational Cost 25%
• Charge Carriers 25%
• Gate Oxide 25%
• Drain Induced Barrier Lowering 25%
• Machine Learning 25%
• Threshold Voltage 25%
• Downscaling 25%
• Detrapping 25%
• Statistical Fluctuations 25%
• Semiconductor Devices 25%
• Device Simulation 25%
• Random Defects 25%
• Device Variability 25%
• Defect Analysis 25%
• Multipoint 25%

Engineering

• Field-Effect Transistor 100%
• Learning Approach 100%
• Learning System 100%
• Interface Trap 100%
• Simulation Result 20%
• Subthreshold Slope 20%
• Metal Gate 20%
• Gate Oxide 20%
• Computational Cost 20%
• Semiconductor Device 20%
• Random Defect 20%
• Simulated Data 20%
• Charge Carrier 20%

Material Science

• Field Effect Transistor 100%
• Oxide Compound 33%
• Silicon 33%
• Charge Carrier 33%
• Semiconductor Device 33%
• Point Defect 33%