Abstract
We achieve low-temperature Cu-to-Cu direct bonding using highly (1 1 1)-orientated Cu films. The bonding temperature can be lowered to 200 C at a stress of 114 psi for 30 min at 10-3 torr. The temperature is lower than the reflow temperature of 250 C for Pb-free solders. Our breakthrough is based on the finding that the Cu (1 1 1) surface diffusivity is the fastest among all the planes of Cu and the bonding process can occur through surface diffusion creep on the (1 1 1) surfaces.
Original language | English |
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Pages (from-to) | 65-68 |
Number of pages | 4 |
Journal | Scripta Materialia |
Volume | 78-79 |
DOIs | |
State | Published - May 2014 |
Keywords
- Creep
- Cu-to-Cu direct bonding
- Diffusion
- Preferred orientation