Low optical loss wafer bonded GaAs structures for quasi-phase-matched second harmonic generation

Yew-Chuhg Wu*, Robert S. Feigelson, Roger K. Route, Dong Zheng, Leslie A. Gordon, Martin M. Fejer, Robert L. Byer

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


A periodic GaAs wafer-bonded structure has been proposed for quasi-phase-matched (QPM) second harmonic generation (SHG). However, current bonding processes often lead to unacceptable optical losses and poor device performance. In this study, three sources of optical losses in wafer-bonded structures were investigated, (1) interfacial defects between the wafers, (2) bulk defects within the wafers, and (3) decomposition at the exposed outer surfaces. Surface losses due to incongruent evaporation were easily eliminated by repolishing the outer surfaces. However, to minimize the losses from interfacial and bulk defects, it was necessary to investigate the relationship between these defects and the bonding parameters. It was found that an increase in bonding temperature and/or time led to a decrease in interfacial defects, but an increase in bulk and surface defects. Through a trade-off process, optimized processing conditions were developed which permitted the preparation of bonded stacks containing over 50 (100)-oriented GaAs wafers, and about 40 layers of (110))-oriented GaAs wafers. Optical losses as low as 0.1-0.3% /interface (at 5.3 μm and 10.6 μm) were achieved.

Original languageEnglish
Pages (from-to)481-486
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1 Dec 1997
EventProceedings of the 1997 MRS Fall Symposium - Boston, MA, USA
Duration: 30 Nov 19974 Dec 1997


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