Low-leakage electrostatic discharge protection circuit in 65-nm fully-silicided CMOS technology

  • Chang Tzu Wang*
  • , Ming-Dou Ker
  • , Tien Hao Tang
  • , Kuan Cheng Su
    • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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    Engineering