Low-capacitance ESD protection design for high-speed I/O interfaces in a 130-nm CMOS process

Yuan Wen Hsiao*, Ming-Dou Ker

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    10 Scopus citations

    Fingerprint

    Dive into the research topics of 'Low-capacitance ESD protection design for high-speed I/O interfaces in a 130-nm CMOS process'. Together they form a unique fingerprint.

    Physics & Astronomy

    Engineering & Materials Science

    Chemical Compounds