Logic/resistive-switching hybrid transistor for two-bit-per-cell storage

Shih Chieh Wu, Chieh Lo, Tuo-Hung Hou*

*Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

    Abstract

    Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the V D-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible V TH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.

    Original languageEnglish
    Title of host publication2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012 - Proceedings of Technical Papers
    DOIs
    StatePublished - 2012
    Event2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012 - Hsinchu, Taiwan
    Duration: 23 Apr 201225 Apr 2012

    Publication series

    NameInternational Symposium on VLSI Technology, Systems, and Applications, Proceedings
    ISSN (Print)1930-8868

    Conference

    Conference2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012
    Country/TerritoryTaiwan
    CityHsinchu
    Period23/04/1225/04/12

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