TY - GEN
T1 - Logic/resistive-switching hybrid transistor for two-bit-per-cell storage
AU - Wu, Shih Chieh
AU - Lo, Chieh
AU - Hou, Tuo-Hung
PY - 2012
Y1 - 2012
N2 - Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the V D-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible V TH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.
AB - Various bias schemes in the RS-TFT have been comprehensively investigated. As shown in Table I, the V D-biased bipolar RS is superior for the logic/RS hybrid operation with the ability of two-bit-per-cell storage because of its large program margin, localized filament location, negligible V TH shift, and suppressed gate leakage current. In comparison with other embedded memory technologies, the proposed RS-TFT in this work not only is compatible with logic CMOS technology, but also provides comparable memory performance with a very competitive cell size.
UR - http://www.scopus.com/inward/record.url?scp=84863655787&partnerID=8YFLogxK
U2 - 10.1109/VLSI-TSA.2012.6210103
DO - 10.1109/VLSI-TSA.2012.6210103
M3 - Conference contribution
AN - SCOPUS:84863655787
SN - 9781457720840
T3 - International Symposium on VLSI Technology, Systems, and Applications, Proceedings
BT - 2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012 - Proceedings of Technical Papers
T2 - 2012 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA 2012
Y2 - 23 April 2012 through 25 April 2012
ER -