Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

M. Schulz-Ruhtenberg; T. Ackemann; Kai-Feng Huang; I. Babushkin; N. Loiko

doi:10.1109/EQEC.2005.1567321

Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

M. Schulz-Ruhtenberg^*, T. Ackemann, Kai-Feng Huang, I. Babushkin, N. Loiko

^*Corresponding author for this work

Department of Electrophysics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2005 European Quantum Electronics Conference, EQEC '05
Pages	150
Number of pages	1
DOIs	https://doi.org/10.1109/EQEC.2005.1567321
State	Published - 2005
Event	2005 European Quantum Electronics Conference, EQEC '05 - Munich, Germany Duration: 12 Jun 2005 → 17 Jun 2005

Publication series

Name	2005 European Quantum Electronics Conference, EQEC '05
Volume	2005

Conference

Conference	2005 European Quantum Electronics Conference, EQEC '05
Country/Territory	Germany
City	Munich
Period	12/06/05 → 17/06/05

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10.1109/EQEC.2005.1567321

Cite this

Schulz-Ruhtenberg, M., Ackemann, T., Huang, K.-F., Babushkin, I., & Loiko, N. (2005). Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. In 2005 European Quantum Electronics Conference, EQEC '05 (pp. 150). Article 1567321 (2005 European Quantum Electronics Conference, EQEC '05; Vol. 2005). https://doi.org/10.1109/EQEC.2005.1567321

@inproceedings{7d3bd098ec7c4e58b288fef8091624c1,

title = "Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers",

author = "M. Schulz-Ruhtenberg and T. Ackemann and Kai-Feng Huang and I. Babushkin and N. Loiko",

year = "2005",

doi = "10.1109/EQEC.2005.1567321",

language = "English",

isbn = "0780389735",

series = "2005 European Quantum Electronics Conference, EQEC '05",

pages = "150",

booktitle = "2005 European Quantum Electronics Conference, EQEC '05",

note = "2005 European Quantum Electronics Conference, EQEC '05 ; Conference date: 12-06-2005 Through 17-06-2005",

}

Schulz-Ruhtenberg, M, Ackemann, T, Huang, K-F, Babushkin, I & Loiko, N 2005, Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. in 2005 European Quantum Electronics Conference, EQEC '05., 1567321, 2005 European Quantum Electronics Conference, EQEC '05, vol. 2005, pp. 150, 2005 European Quantum Electronics Conference, EQEC '05, Munich, Germany, 12/06/05. https://doi.org/10.1109/EQEC.2005.1567321

Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers. / Schulz-Ruhtenberg, M.; Ackemann, T.; Huang, Kai-Feng et al.
2005 European Quantum Electronics Conference, EQEC '05. 2005. p. 150 1567321 (2005 European Quantum Electronics Conference, EQEC '05; Vol. 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

AU - Schulz-Ruhtenberg, M.

AU - Ackemann, T.

AU - Huang, Kai-Feng

AU - Babushkin, I.

AU - Loiko, N.

PY - 2005

Y1 - 2005

UR - http://www.scopus.com/inward/record.url?scp=33847304142&partnerID=8YFLogxK

U2 - 10.1109/EQEC.2005.1567321

DO - 10.1109/EQEC.2005.1567321

M3 - Conference contribution

AN - SCOPUS:33847304142

SN - 0780389735

SN - 9780780389731

T3 - 2005 European Quantum Electronics Conference, EQEC '05

SP - 150

BT - 2005 European Quantum Electronics Conference, EQEC '05

T2 - 2005 European Quantum Electronics Conference, EQEC '05

Y2 - 12 June 2005 through 17 June 2005

ER -

Length scales and polarization properties of transverse patterns in broad-area vertical-cavity surface-emitting lasers

Publication series

Conference

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