Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits

  • Yi-Ming Li*
  • , Chih Hong Hwang
  • , Ta Ching Yeh
  • , Tien Yen Li
    • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

16 Scopus citations

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