InZnO capped with InZnO:Si bi-stack layers for enhanced photo-bias stability and performance in metal oxide thin film transistors

Ram Narayan Chauhan, Nidhi Tiwari, Ya-Hsiang Tai, Po-Tsun Liu, Han Ping D. Shieh

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Fingerprint

Dive into the research topics of 'InZnO capped with InZnO:Si bi-stack layers for enhanced photo-bias stability and performance in metal oxide thin film transistors'. Together they form a unique fingerprint.

Keyphrases

Material Science

Earth and Planetary Sciences

Engineering

Chemical Engineering

Medicine and Dentistry