Investigation on selectively etched SiGe and Si surface for Gate-All-Around CMOS devices fabrication
- Wei Yuan Chang
- , Chun Lin Chu
- , Guang Li Luo*
- , Yi Shuo Huang
- , Chun Hsiung Lin
- , Po Jung Sung
- , Yao-Jen Lee
- , Shih Hong Chen
- , Bo Yuan Chen
- , Wen Fa Wu*
- , Wen Kuan Yeh
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
5
Scopus
citations