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Investigation on Polarization and Trapping Dominated Reliability for Ferroelectric-HfZrOxGe FinFET Inverters
Tzu Chieh Hong, Chun-Jung Su, Yao Jen Lee, Yi-Ming Li, Seiji Samukawa, Tien-Sheng Chao
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations