Investigation on Polarization and Trapping Dominated Reliability for Ferroelectric-HfZrOxGe FinFET Inverters

Tzu Chieh Hong, Chun-Jung Su, Yao Jen Lee, Yi-Ming Li, Seiji Samukawa, Tien-Sheng Chao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

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Engineering & Materials Science

Chemical Compounds