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Dive into the research topics of 'Investigation of the time dependent gate dielectric stability in SiC MOSFETs with planar and trench gate structures'. Together they form a unique fingerprint.- Sort by
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Wei Cheng Lin, Wei Chen Yu, Bang Ren Chen, Yu Sheng Hsiao, Zhen Hong Huang, Chia Lung Hung, Yi Kai Hsiao, Nai Jen Yeh, Hao Chung Kuo, Chang Ching Tu*, Tian Li Wu
Research output: Contribution to journal › Article › peer-review