Investigation of the time dependent gate dielectric stability in SiC MOSFETs with planar and trench gate structures
- Wei Cheng Lin
- , Wei Chen Yu
- , Bang Ren Chen
- , Yu Sheng Hsiao
- , Zhen Hong Huang
- , Chia Lung Hung
- , Yi Kai Hsiao
- , Nai Jen Yeh
- , Hao Chung Kuo
- , Chang Ching Tu*
- , Tian Li Wu
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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