Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation

Yu Sheng Wu; Pin Su

doi:10.1109/VTSA.2007.378965

Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation

Yu Sheng Wu^*, Pin Su

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers
DOIs	https://doi.org/10.1109/VTSA.2007.378965
State	Published - 2007
Event	2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Hsinchu, Taiwan Duration: 23 Apr 2007 → 25 Apr 2007

Publication series

Name	International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Conference

Conference	2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA
Country/Territory	Taiwan
City	Hsinchu
Period	23/04/07 → 25/04/07

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10.1109/VTSA.2007.378965

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Wu, Y. S., & Su, P. (2007). Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation. In 2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers Article 4239533 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings). https://doi.org/10.1109/VTSA.2007.378965

@inproceedings{dac97772cbdc4188af68a960056eb1a1,

title = "Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation",

author = "Wu, {Yu Sheng} and Pin Su",

year = "2007",

doi = "10.1109/VTSA.2007.378965",

language = "English",

isbn = "1424405858",

series = "International Symposium on VLSI Technology, Systems, and Applications, Proceedings",

booktitle = "2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers",

note = "2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA ; Conference date: 23-04-2007 Through 25-04-2007",

}

Wu, YS & Su, P 2007, Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation. in 2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers., 4239533, International Symposium on VLSI Technology, Systems, and Applications, Proceedings, 2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA, Hsinchu, Taiwan, 23/04/07. https://doi.org/10.1109/VTSA.2007.378965

Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation. / Wu, Yu Sheng; Su, Pin.
2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers. 2007. 4239533 (International Symposium on VLSI Technology, Systems, and Applications, Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation

AU - Wu, Yu Sheng

AU - Su, Pin

PY - 2007

Y1 - 2007

UR - http://www.scopus.com/inward/record.url?scp=34548861474&partnerID=8YFLogxK

U2 - 10.1109/VTSA.2007.378965

DO - 10.1109/VTSA.2007.378965

M3 - Conference contribution

AN - SCOPUS:34548861474

SN - 1424405858

SN - 9781424405855

T3 - International Symposium on VLSI Technology, Systems, and Applications, Proceedings

BT - 2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA - Proceedings of Technical Papers

T2 - 2007 International Symposium on VLSI Technology, Systems and Applications, VLSI-TSA

Y2 - 23 April 2007 through 25 April 2007

ER -

Investigation of scaling for multi-gate MOSFETs using analytical solution of 3-D poisson's equation

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