Investigation of hot carrier reliability of ultrathin poly-Si nanobelt junctionless (UTNB-JL) transistors on different underlying insulators

Jen Hong Chang, Chun Chih Chung, Jer Yi Lin, Tien-Sheng Chao

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

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Material Science

Chemical Engineering

Engineering