Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on Vt Retention Loss in a Multilevel Charge Trap Flash Memory

Yu Heng Liu, Ting Chien Zhan, Tahui Wang*, Wen Jer Tsai, Tao Cheng Lu, Kuang Chao Chen, Chih Yuan Lu

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Fingerprint

Dive into the research topics of 'Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on Vt Retention Loss in a Multilevel Charge Trap Flash Memory'. Together they form a unique fingerprint.

Keyphrases

Engineering