Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

S. Y. Huang; J. J. Liang; Shih-Ying Hsu; L. K. Lin; T. C. Tsai; S. F. Lee

doi:10.1140/epjb/e2010-10051-y

Investigation of Cu _0.5Ni _0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

S. Y. Huang, J. J. Liang, Shih-Ying Hsu, L. K. Lin, T. C. Tsai, S. F. Lee

Department of Electrophysics

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu _0.5Ni _0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.

Original language	English
Pages (from-to)	153-162
Number of pages	10
Journal	European Physical Journal B
Volume	79
Issue number	2
DOIs	https://doi.org/10.1140/epjb/e2010-10051-y
State	Published - Jan 2011

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title = "Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement",

abstract = "A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu 0.5Ni 0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.",

author = "Huang, {S. Y.} and Liang, {J. J.} and Shih-Ying Hsu and Lin, {L. K.} and Tsai, {T. C.} and Lee, {S. F.}",

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T1 - Investigation of Cu 0.5Ni 0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

AU - Huang, S. Y.

AU - Liang, J. J.

AU - Hsu, Shih-Ying

AU - Lin, L. K.

AU - Tsai, T. C.

AU - Lee, S. F.

PY - 2011/1

Y1 - 2011/1

N2 - A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu 0.5Ni 0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.

AB - A direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu 0.5Ni 0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.

UR - http://www.scopus.com/inward/record.url?scp=79951513693&partnerID=8YFLogxK

U2 - 10.1140/epjb/e2010-10051-y

DO - 10.1140/epjb/e2010-10051-y

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SN - 1434-6028

VL - 79

SP - 153

EP - 162

JO - European Physical Journal B

JF - European Physical Journal B

IS - 2

ER -

Investigation of Cu _0.5Ni _0.5/Nb interface transparency by using current-perpendicular-to-plane measurement

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