TY - JOUR
T1 - Interface resistance and transparency in ferromagnet/superconductor Co Nbx Ti1-x multilayers (x=1, 0.6, and 0.4)
AU - Huang, S. Y.
AU - Lee, S. F.
AU - Hsu, Shih-ying
AU - Yao, Y. D.
PY - 2007/7/30
Y1 - 2007/7/30
N2 - The quantitative interface resistance between polycrystalline ferromagnetic Co and Nbx Ti1-x, with x=1, 0.6, and 0.4, is measured and analyzed at 4.2 K. Both the superconducting and normal states of Nbx Ti1-x, respectively, above and below the superconducting critical thickness, are studied with current flowing perpendicular to the interface. A one-band series-resistance model is used to analyze our data. The interface transparencies in terms of the ratio between interface resistance and various physical quantities are discussed.
AB - The quantitative interface resistance between polycrystalline ferromagnetic Co and Nbx Ti1-x, with x=1, 0.6, and 0.4, is measured and analyzed at 4.2 K. Both the superconducting and normal states of Nbx Ti1-x, respectively, above and below the superconducting critical thickness, are studied with current flowing perpendicular to the interface. A one-band series-resistance model is used to analyze our data. The interface transparencies in terms of the ratio between interface resistance and various physical quantities are discussed.
UR - http://www.scopus.com/inward/record.url?scp=34547512234&partnerID=8YFLogxK
U2 - 10.1103/PhysRevB.76.024521
DO - 10.1103/PhysRevB.76.024521
M3 - Article
AN - SCOPUS:34547512234
SN - 1098-0121
VL - 76
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 2
M1 - 024521
ER -