TY - GEN
T1 - Input selection encoding for low power multiplexer tree
AU - Chang, Hsiao En
AU - Huang, Juinn-Dar
AU - Chen, Chia I.
PY - 2007/9/28
Y1 - 2007/9/28
N2 - With the advent of portable devices, power consumption becomes one of the most important considerations in VLSI designs. Multiplexer (MUX) is a basic component massively used in typical VLSI designs. In this paper, we focus on the minimization of switching activities in a MUX tree composed of 2-to-1 MUXes. The key contribution of this paper is: Given the on probabilities and the selection probabilities of input data signals, the proposed heuristic algorithm can properly encode all input data signals such that the power consumption of the resultant MUX tree is minimized. For a 64-to-1 MUX, the experimental results show that a MUX tree encoded by the proposed algorithm consumes 24% less power than a randomly-encoded tree on average.
AB - With the advent of portable devices, power consumption becomes one of the most important considerations in VLSI designs. Multiplexer (MUX) is a basic component massively used in typical VLSI designs. In this paper, we focus on the minimization of switching activities in a MUX tree composed of 2-to-1 MUXes. The key contribution of this paper is: Given the on probabilities and the selection probabilities of input data signals, the proposed heuristic algorithm can properly encode all input data signals such that the power consumption of the resultant MUX tree is minimized. For a 64-to-1 MUX, the experimental results show that a MUX tree encoded by the proposed algorithm consumes 24% less power than a randomly-encoded tree on average.
UR - http://www.scopus.com/inward/record.url?scp=34648828046&partnerID=8YFLogxK
U2 - 10.1109/VDAT.2007.373253
DO - 10.1109/VDAT.2007.373253
M3 - Conference contribution
AN - SCOPUS:34648828046
SN - 1424405831
SN - 9781424405831
T3 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
BT - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007 - Proceedings of Technical Papers
T2 - 2007 International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2007
Y2 - 25 April 2007 through 27 April 2007
ER -