Innovative Recovery Strategy for MFIS-FeFETs at Optimal Timing With Robust Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02%), and Self-Tracking Circuit Design

Cheng Hung Wu, Jay Liu, Xun Ting Zheng, Han Fu Chuang, Yi Ming Tseng, Masaharu Kobayashi, Chun Jung Su*, Vita Pi Ho Hu*

*Corresponding author for this work

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Engineering

Material Science