InGaZnO Ferroelectric Thin-Film Transistor Using HfO/AlO/AlN Hybrid Gate Dielectric Stack With Ultra-Large Memory Window

Min Lu Kao, Yan Kui Liang, Yuan Lin, You Chen Weng, Chang Fu Dee, Po Tsun Liu, Ching Ting Lee, Edward Yi Chang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'InGaZnO Ferroelectric Thin-Film Transistor Using HfO/AlO/AlN Hybrid Gate Dielectric Stack With Ultra-Large Memory Window'. Together they form a unique fingerprint.

Keyphrases

Material Science

Engineering

Physics