Inelastic electron dephasing times in CuxGe100-x alloys

Juhn-Jong Lin; P. J. Sheng; Shih-ying Hsu

doi:10.1016/S0921-4526(99)01836-0

Inelastic electron dephasing times in Cu_xGe_100-x alloys

Juhn-Jong Lin^*, P. J. Sheng, Shih-ying Hsu

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

2 Scopus citations

Abstract

We have studied the inelastic electron dephasing scattering times, τ_i, in disordered Cu_xGe_100-x (35 ≤ x ≤ 60) alloys between 1 and 15 K. The values of τ_i^-1 (approx. T^p), and especially the exponent of temperature p, are extracted from weak localization studies. We find that the value of p continuously decreases from approx. 3 to approx. 1 as x gradually decreases from 60 to 35. Our observation is understood in terms of a crossover of the inelastic electron dephasing in impure metals from e-ph scattering to critical e-e scattering as the disorder greatly increases and the system moves significantly toward the mobility edge.

Original language	English
Pages (from-to)	460-461
Number of pages	2
Journal	Physica B: Condensed Matter
Volume	280
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4526(99)01836-0
State	Published - 11 May 2000
Event	22nd International Conference on Low Temperature Physics (LT-22) - Helsinki, Finl Duration: 4 Aug 1999 → 11 Aug 1999

Keywords

Dephasing times
Disordered metals
Electron-electron relaxation
Electron-phonon relaxation

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10.1016/S0921-4526(99)01836-0

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title = "Inelastic electron dephasing times in CuxGe100-x alloys",

abstract = "We have studied the inelastic electron dephasing scattering times, τi, in disordered CuxGe100-x (35 ≤ x ≤ 60) alloys between 1 and 15 K. The values of τi-1 (approx. Tp), and especially the exponent of temperature p, are extracted from weak localization studies. We find that the value of p continuously decreases from approx. 3 to approx. 1 as x gradually decreases from 60 to 35. Our observation is understood in terms of a crossover of the inelastic electron dephasing in impure metals from e-ph scattering to critical e-e scattering as the disorder greatly increases and the system moves significantly toward the mobility edge.",

keywords = "Dephasing times, Disordered metals, Electron-electron relaxation, Electron-phonon relaxation",

author = "Juhn-Jong Lin and Sheng, {P. J.} and Shih-ying Hsu",

year = "2000",

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doi = "10.1016/S0921-4526(99)01836-0",

language = "English",

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pages = "460--461",

journal = "Physica B: Condensed Matter",

issn = "0921-4526",

publisher = "Elsevier",

number = "1-4",

note = "22nd International Conference on Low Temperature Physics (LT-22) ; Conference date: 04-08-1999 Through 11-08-1999",

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TY - JOUR

T1 - Inelastic electron dephasing times in CuxGe100-x alloys

AU - Lin, Juhn-Jong

AU - Sheng, P. J.

AU - Hsu, Shih-ying

PY - 2000/5/11

Y1 - 2000/5/11

N2 - We have studied the inelastic electron dephasing scattering times, τi, in disordered CuxGe100-x (35 ≤ x ≤ 60) alloys between 1 and 15 K. The values of τi-1 (approx. Tp), and especially the exponent of temperature p, are extracted from weak localization studies. We find that the value of p continuously decreases from approx. 3 to approx. 1 as x gradually decreases from 60 to 35. Our observation is understood in terms of a crossover of the inelastic electron dephasing in impure metals from e-ph scattering to critical e-e scattering as the disorder greatly increases and the system moves significantly toward the mobility edge.

AB - We have studied the inelastic electron dephasing scattering times, τi, in disordered CuxGe100-x (35 ≤ x ≤ 60) alloys between 1 and 15 K. The values of τi-1 (approx. Tp), and especially the exponent of temperature p, are extracted from weak localization studies. We find that the value of p continuously decreases from approx. 3 to approx. 1 as x gradually decreases from 60 to 35. Our observation is understood in terms of a crossover of the inelastic electron dephasing in impure metals from e-ph scattering to critical e-e scattering as the disorder greatly increases and the system moves significantly toward the mobility edge.

KW - Dephasing times

KW - Disordered metals

KW - Electron-electron relaxation

KW - Electron-phonon relaxation

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U2 - 10.1016/S0921-4526(99)01836-0

DO - 10.1016/S0921-4526(99)01836-0

M3 - Conference article

AN - SCOPUS:0033878693

SN - 0921-4526

VL - 280

SP - 460

EP - 461

JO - Physica B: Condensed Matter

JF - Physica B: Condensed Matter

IS - 1-4

T2 - 22nd International Conference on Low Temperature Physics (LT-22)

Y2 - 4 August 1999 through 11 August 1999

ER -

Inelastic electron dephasing times in Cu_xGe_100-x alloys

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Keywords

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