Abstract
FexTe thin films were prepared on SrTiO3 (001) substrates by molecular beam epitaxy in a well-ordered epitaxial layer-by-layer fashion. The composition of the films was varied by adjusting the Te flux in a Te-limited growth regime. Changes in the electronic structure were systematically studied using in situ x-ray absorption spectroscopy at the Fe L2,3 and Te M4,5 edges and x-ray photoelectron spectroscopy of core levels and valence band. We found that FeTe with optimized composition (Fe/Te ratio ≈ 1) provides the sharpest spectral features, indicating that Fe1.00Te can be synthesized as a thin film, although it is not possible in bulk.
| Original language | English |
|---|---|
| Article number | 245139 |
| Journal | Physical Review B |
| Volume | 110 |
| Issue number | 24 |
| DOIs | |
| State | Published - 15 Dec 2024 |
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