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In situ x-ray absorption and photoelectron spectroscopy on epitaxial FexTe thin films with a wide range of Fe/Te compositions

  • C. E. Liu
  • , C. N. Wu
  • , J. Falke
  • , C. F. Chang
  • , C. Y. Kuo
  • , S. Yang
  • , J. Y. Juang
  • , C. Koz
  • , U. Schwarz
  • , C. T. Chen
  • , L. H. Tjeng
  • , S. G. Altendorf

Research output: Contribution to journalArticlepeer-review

Abstract

FexTe thin films were prepared on SrTiO3 (001) substrates by molecular beam epitaxy in a well-ordered epitaxial layer-by-layer fashion. The composition of the films was varied by adjusting the Te flux in a Te-limited growth regime. Changes in the electronic structure were systematically studied using in situ x-ray absorption spectroscopy at the Fe L2,3 and Te M4,5 edges and x-ray photoelectron spectroscopy of core levels and valence band. We found that FeTe with optimized composition (Fe/Te ratio ≈ 1) provides the sharpest spectral features, indicating that Fe1.00Te can be synthesized as a thin film, although it is not possible in bulk.

Original languageEnglish
Article number245139
JournalPhysical Review B
Volume110
Issue number24
DOIs
StatePublished - 15 Dec 2024

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