Impulse response fault model and fault extraction for functional level analog circuit diagnosis

Chau-Chin Su; Shenshung Chiang; Shyh-Jye Jou

doi:10.1109/ICCAD.1995.480195

Impulse response fault model and fault extraction for functional level analog circuit diagnosis

Chau-Chin Su^*, Shenshung Chiang, Shyh-Jye Jou

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › peer-review

8 Scopus citations

Abstract

In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.

Original language	English
Pages (from-to)	631-636
Number of pages	6
Journal	IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers
DOIs	https://doi.org/10.1109/ICCAD.1995.480195
State	Published - 1995
Event	Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design - San Jose, CA, USA Duration: 5 Nov 1995 → 9 Nov 1995

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10.1109/ICCAD.1995.480195

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title = "Impulse response fault model and fault extraction for functional level analog circuit diagnosis",

abstract = "In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.",

author = "Chau-Chin Su and Shenshung Chiang and Shyh-Jye Jou",

year = "1995",

doi = "10.1109/ICCAD.1995.480195",

language = "English",

pages = "631--636",

journal = "IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers",

issn = "1092-3152",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design ; Conference date: 05-11-1995 Through 09-11-1995",

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TY - JOUR

T1 - Impulse response fault model and fault extraction for functional level analog circuit diagnosis

AU - Su, Chau-Chin

AU - Chiang, Shenshung

AU - Jou, Shyh-Jye

PY - 1995

Y1 - 1995

N2 - In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.

AB - In this paper, a functional fault model for analog circuit diagnosis is proposed. A faulty module is modeled as a fault-free module in serial or in parallel with a fault module. To extract such a fault module, we adopt an iterative deconvolution technique to deconvolute the impulse response of the fault module from the faulty response. The test results show that with such a fault model and fault extraction technique the diagnostic resolution is improved significantly due to the separation of the fault and the system function. Moreover, such a fault model allows single-module fault tables to be applied to the diagnosis of a multi-module system.

UR - http://www.scopus.com/inward/record.url?scp=0029530285&partnerID=8YFLogxK

U2 - 10.1109/ICCAD.1995.480195

DO - 10.1109/ICCAD.1995.480195

M3 - Conference article

AN - SCOPUS:0029530285

SN - 1092-3152

SP - 631

EP - 636

JO - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

JF - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

T2 - Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design

Y2 - 5 November 1995 through 9 November 1995

ER -

Impulse response fault model and fault extraction for functional level analog circuit diagnosis

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