Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs

Catherine Langpoklakpam, An Chen Liu, Neng Jie You, Ming Hsuan Kao, Wen Hsien Huang, Chang Hong Shen, Jerry Tzou, Hao Chung Kuo*, Jia Min Shieh

*Corresponding author for this work

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Engineering & Materials Science