Improving radiation hardness of EEPROM/flash cell by N 2 O annealing

Tiao Yuan Huang*, Fuh Cheng Jong, Tien-Sheng Chao, Horng-Chih Lin, Len Yi Leu, Konrad Young, Chen Hsi Lin, Kuang Y. Chiu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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