Improving Cell-Aware Test for Intra-Cell Short Defects

Dong Zhen Lee, Ying Yen Chen, Kai Chiang Wu, Mango C.T. Chao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Conventional fault models define their faulty behavior at the IO ports of standard cells with simple rules of fault activation and fault propagation. However, there still exist some defects inside a cell (intra-cell) that cannot be effectively detected by the test patterns of conventional fault models and hence become a source of DPPM. In order to further increase the defect coverage, many research works have been conducted to study the fault models resulting from different types of intra-cell defects, by SPICE-simulating each targeted defect with its equivalent circuit-level defect model. In this paper, we propose to improve cell-aware (CA) test methodology by concentrating on intracell bridging faults due to short defects inside standard cells. The faults extracted are based on examining the actual physical proximity of polygons in the layout of a cell, and are thus more realistic and reasonable than those (faults) determined by RC extraction. Experimental results on a set of industrial designs show that the proposed methodology can indeed improve the test quality of intra-cell bridging faults. On average, 0.36 % and 0.47% increases in fault coverage can be obtained for 1-time-frame and 2-time-frame CA tests, respectively. In addition to short defects between two metal polygons, short defects among three metal polygons are also considered in our methodology for another 9.33 % improvement in fault coverage.

Original languageEnglish
Title of host publicationProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
EditorsCristiana Bolchini, Ingrid Verbauwhede, Ioana Vatajelu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages436-441
Number of pages6
ISBN (Electronic)9783981926361
DOIs
StatePublished - 2022
Event2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 - Virtual, Online, Belgium
Duration: 14 Mar 202223 Mar 2022

Publication series

NameProceedings of the 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022

Conference

Conference2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022
Country/TerritoryBelgium
CityVirtual, Online
Period14/03/2223/03/22

Fingerprint

Dive into the research topics of 'Improving Cell-Aware Test for Intra-Cell Short Defects'. Together they form a unique fingerprint.

Cite this