Abstract
We present in this paper the MOCVD growth and characterization of high performance 850nm InGaAsP/InGaP strain-compensated MQWs vertical-cavity surface-emitting lasers (VCSELs). These VCSELs exhibit superior characteristics, with threshold currents ∼0.4 mA, and slope efficiencies ∼ 0.6 mW/mA. The threshold current change is less than 0.2 mA and the slope efficiency drops by less than ∼30% when the substrate temperature is raised from room temperature to 85°C. These VCSELs also demonstrate high speed modulation bandwidth up to 12.5Gbit/s from 25°C to 85°C.
Original language | English |
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Pages (from-to) | 221-226 |
Number of pages | 6 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 5364 |
DOIs | |
State | Published - 2004 |
Event | Vertical-Cavity Surface-Emitting lasers VIII - San Jose, CA, United States Duration: 28 Jan 2004 → 29 Jan 2004 |
Keywords
- High speed
- InGaAsP
- MOCVD
- Strain-compensated
- VCSELs