Improved retention characteristic in polycrystalline silicon-oxide-hafnium oxide-oxide-silicon-type nonvolatile memory with robust tunnel oxynitride
Chih Ren Hsieh, Chiung Hui Lai, Bo Chun Lin, Yuan Kai Zheng, Jen Chung Lou, Kuo-Jui Lin
Research output: Contribution to journal › Article › peer-review
2Scopus
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