Improved luminance intensity of InGaN-GaN light-emitting diode by roughening both p-GaN and undoped-GaN surfaces and applying a mirror to the sapphire substrate surface

Cheng Liao*, Wei Chih Peng, Yew-Chuhg Wu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

InGaN-GaN light emitting diodes (LEDs) with double roughened surfaces and silver mirror was fabricated by surface-roughening, wafer-bonding and laser lift-off technologies. It was found the light intensity of DRM-LED (with mirror between undoped-GaN/sapphire interface) was 3.05 times higher than that of the PR-LED (with only roughened p-GaN surface), and 1.45 times higher than that of the DRSM-LED (with mirror on the backside of sapphire substrate).

Original languageEnglish
Title of host publicationECS Transactions - 46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface
Pages201-203
Number of pages3
Edition2
DOIs
StatePublished - 1 Dec 2007
Event46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface - 211th ECS Meeting - Chicago, IL, United States
Duration: 6 May 200710 May 2007

Publication series

NameECS Transactions
Number2
Volume6
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference46th State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XLVI) and the 2nd International Symposium on Processes at the Semiconductor-Solution Interface - 211th ECS Meeting
Country/TerritoryUnited States
CityChicago, IL
Period6/05/0710/05/07

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