Impacts of work function variation and line edge roughness on hybrid TFET-MOSFET monolithic 3D SRAMs

Jian Hao Wang, Pin Su, Ching Te Chuang

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    1 Scopus citations

    Fingerprint

    Dive into the research topics of 'Impacts of work function variation and line edge roughness on hybrid TFET-MOSFET monolithic 3D SRAMs'. Together they form a unique fingerprint.

    Keyphrases

    Engineering