Impact on the Conductance Method of the Asymmetry in the AC Response Induced by Interface Trap Levels

Hsin Jyun Lin*, Hiroshi Watanabe, Akinobu Teramoto, Rihito Kuroda, Kota Umezawa, Kiichi Furukawa, Shigetoshi Sugawa

*Corresponding author for this work

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Engineering & Materials Science

Chemical Compounds