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Impact of post deposition annealing on resistive switching in Ga2O3-based conductive-bridge RAM devices

  • Kai Jhih Gan
  • , Po-Tsun Liu*
  • , Ta Chun Chien
  • , Dun Bao Ruan
  • , Yu Chuan Chiu
  • , Simon M. Sze
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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