In our previous study, using NF3 annealed poly-Si to improve gate oxide integrity for Co-silicide process has been proposed [SSDM, 1998, p. 164]. It is very interesting and important to know the mechanism of both F and N incorporation in the SiO2 and Co-salicide. In this study, F and/or N will be implanted into poly-Si with/without Co-salicide process, to identify the interaction of N and F in the SiO2 and Co-salicide process. In our work, we will describe the optimized structure and F/N incorporation for Co-silicide process.
|Number of pages||5|
|State||Published - 1 Aug 2002|
- Breakdown charge and stress induce leakage current (SILC)
- Fluorine and nitrogen implantation
- Gate oxide integrity (GOI)
- Leakage performance