Impact of guard ring layout on the stacked low-voltage PMOS for high-voltage ESD protection

Seian Feng Liao, Kai Neng Tang, Ming-Dou Ker, Jia Rong Yeh, Hwa Chyi Chiou, Yeh Jen Huang, Chun Chien Tsai, Yeh Ning Jou, Geeng Lih Lin

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

    3 Scopus citations

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    Engineering & Materials Science