Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors

Chia Wen Zhong, Horng-Chih Lin, Jung Ruey Tsai, Kou Chen Liu, Tiao Yuan Huang

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Fingerprint

Dive into the research topics of 'Impact of gate dielectrics and oxygen annealing on tin-oxide thin-film transistors'. Together they form a unique fingerprint.

Keyphrases

Material Science