Impact of current distribution on RRAM array with high and low Ion/Ioff devices

V. Mohammed Zackriya; Albert Chin; Harish M. Kittur

doi:10.1109/EDTM.2017.7947557

Impact of current distribution on RRAM array with high and low I_on/I_off devices

V. Mohammed Zackriya, Albert Chin, Harish M. Kittur

Institute of Electronics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

7 Scopus citations

Abstract

Using novel circuit design topology to include the sneak path current as a reference input, the performance of two RRAM devices with I_on/I_off of 26 and 925 were compared for crosspoint array. The RRAM with better current distribution outperforms the RRAM with 36X higher I_on/I_off, on crosspoint array. Thus, the RRAM devices should aim on tightening the current distribution, where high I_on/I_off also consumes high power on circuit.

Original language	English
Title of host publication	2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	156-157
Number of pages	2
ISBN (Electronic)	9781509046591
DOIs	https://doi.org/10.1109/EDTM.2017.7947557
State	Published - 13 Jun 2017
Event	2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Toyama, Japan Duration: 28 Feb 2017 → 2 Mar 2017

Publication series

Name	2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings

Conference

Conference	2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017
Country/Territory	Japan
City	Toyama
Period	28/02/17 → 2/03/17

Keywords

I/I and distribution
RRAM array

Access to Document

10.1109/EDTM.2017.7947557

Cite this

Zackriya, V. M., Chin, A., & Kittur, H. M. (2017). Impact of current distribution on RRAM array with high and low I_on/I_off devices. In 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings (pp. 156-157). Article 7947557 (2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDTM.2017.7947557

Zackriya, V. Mohammed ; Chin, Albert ; Kittur, Harish M. / Impact of current distribution on RRAM array with high and low I_on/I_off devices. 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 156-157 (2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings).

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abstract = "Using novel circuit design topology to include the sneak path current as a reference input, the performance of two RRAM devices with Ion/Ioff of 26 and 925 were compared for crosspoint array. The RRAM with better current distribution outperforms the RRAM with 36X higher Ion/Ioff, on crosspoint array. Thus, the RRAM devices should aim on tightening the current distribution, where high Ion/Ioff also consumes high power on circuit.",

keywords = "I/I and distribution, RRAM array",

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year = "2017",

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doi = "10.1109/EDTM.2017.7947557",

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series = "2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings",

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Zackriya, VM, Chin, A & Kittur, HM 2017, Impact of current distribution on RRAM array with high and low I_on/I_off devices. in 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings., 7947557, 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 156-157, 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017, Toyama, Japan, 28/02/17. https://doi.org/10.1109/EDTM.2017.7947557

Impact of current distribution on RRAM array with high and low I_on/I_off devices. / Zackriya, V. Mohammed; Chin, Albert; Kittur, Harish M.
2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2017. p. 156-157 7947557 (2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Zackriya VM, Chin A, Kittur HM. Impact of current distribution on RRAM array with high and low I_on/I_off devices. In 2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2017. p. 156-157. 7947557. (2017 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2017 - Proceedings). doi: 10.1109/EDTM.2017.7947557