Impact of annealing environment on performance of InWZnO conductive bridge random access memory

Chih Chieh Hsu, Po Tsun Liu*, Kai Jhih Gan, Dun Bao Ruan, Yu Chuan Chiu, Simon M. Sze

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

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Engineering

Material Science