Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Cheng Hung Chu; Bau Jung Wu; Tsung-Sheng Kao; Yuan Hsing Fu; Hai Pang Chiang; Din Ping Tsai

doi:10.1109/TMAG.2009.2016156

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Cheng Hung Chu, Bau Jung Wu, Tsung-Sheng Kao, Yuan Hsing Fu, Hai Pang Chiang, Din Ping Tsai

Department of Photonics

Research output: Contribution to journal › Article › peer-review

6 Scopus citations

Abstract

The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

Original language	English
Article number	4815988
Pages (from-to)	2221-2223
Number of pages	3
Journal	IEEE Transactions on Magnetics
Volume	45
Issue number	5
DOIs	https://doi.org/10.1109/TMAG.2009.2016156
State	Published - 1 May 2009

Keywords

Conductive-atomic force microscopy (C-AFM)
Jitter
Recording mark
Writing strategy

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10.1109/TMAG.2009.2016156

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title = "Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output",

abstract = "The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.",

keywords = "Conductive-atomic force microscopy (C-AFM), Jitter, Recording mark, Writing strategy",

author = "Chu, {Cheng Hung} and Wu, {Bau Jung} and Tsung-Sheng Kao and Fu, {Yuan Hsing} and Chiang, {Hai Pang} and Tsai, {Din Ping}",

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AU - Chu, Cheng Hung

AU - Wu, Bau Jung

AU - Kao, Tsung-Sheng

AU - Fu, Yuan Hsing

AU - Chiang, Hai Pang

AU - Tsai, Din Ping

PY - 2009/5/1

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N2 - The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

AB - The relation between recording mark formation and jitter value with Radial Orient Spot (ROS) type laser spot recording was investigated by using a new imaging method of conductive-atomic force microscopy (C-AFM). The readout performances of recording marks were studied by changing the terminal resistance of optical pickup head and writing strategies. The results of clear C-AFM images showed that is possible to adjust the conditions of terminal resistance and writing strategies to have better readout signal performance.

KW - Conductive-atomic force microscopy (C-AFM)

KW - Jitter

KW - Recording mark

KW - Writing strategy

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JF - IEEE Transactions on Magnetics

IS - 5

M1 - 4815988

ER -

Imaging of recording marks and their jitters with different writing strategy and terminal resistance of optical output

Abstract

Keywords

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