IEEE reliability society technical operations annual technical report for 2010

Norm Schneidewin; Mark Montrose; Alec Feinberg; Arbi Ghazarian; Jim McLinn; Christian Hansen; Phil Laplante; Nihal Sinnadurai; Enrico Zio; Wolfgang Kröger; Rick Linger; W. Eric Wong; Vidroha Debroy; Andrew Restrepo; C. W. Wang; Shiuh-Pyng Shieh; Joseph Childs

doi:10.1109/TR.2010.2052190

IEEE reliability society technical operations annual technical report for 2010

Norm Schneidewin^*, Mark Montrose, Alec Feinberg, Arbi Ghazarian, Jim McLinn, Christian Hansen, Phil Laplante, Nihal Sinnadurai, Enrico Zio, Wolfgang Kröger, Rick Linger, W. Eric Wong, Vidroha Debroy, Andrew Restrepo, C. W. Wang, Shiuh-Pyng Shieh, Joseph Childs

^*Corresponding author for this work

Department of Computer Science

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The Annual Technical Report this year is focused on infrastructure reliability. Infrastructure constitutes those things that are apparent only in their absence. We take the infrastructure for granted, assuming it will always be there. We turn on our water facet, and drinkable water has always flowed out, for most of us, most of the time. Our infrastructure is subject to environment breakages (e.g., earthquakes), accidents (e.g., dig ups of cables), sabotage, intrusion, and compromise. Also everyday component, software or system failures can bring our infrastructure down. Our global connectivity and communications, as well as our world wide distributed development and maintenance systems, increase our productivity and efficiency, but can also increase our vulnerabilities. Our critical infrastructures can be found in many places. Medical equipment and devices

Original language	English
Article number	5510015
Pages (from-to)	449-482
Number of pages	34
Journal	IEEE Transactions on Reliability
Volume	59
Issue number	3
DOIs	https://doi.org/10.1109/TR.2010.2052190
State	Published - Sep 2010

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Schneidewin, N., Montrose, M., Feinberg, A., Ghazarian, A., McLinn, J., Hansen, C., Laplante, P., Sinnadurai, N., Zio, E., Kröger, W., Linger, R., Wong, W. E., Debroy, V., Restrepo, A., Wang, C. W., Shieh, S.-P., & Childs, J. (2010). IEEE reliability society technical operations annual technical report for 2010. IEEE Transactions on Reliability, 59(3), 449-482. Article 5510015. https://doi.org/10.1109/TR.2010.2052190

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abstract = "The Annual Technical Report this year is focused on infrastructure reliability. Infrastructure constitutes those things that are apparent only in their absence. We take the infrastructure for granted, assuming it will always be there. We turn on our water facet, and drinkable water has always flowed out, for most of us, most of the time. Our infrastructure is subject to environment breakages (e.g., earthquakes), accidents (e.g., dig ups of cables), sabotage, intrusion, and compromise. Also everyday component, software or system failures can bring our infrastructure down. Our global connectivity and communications, as well as our world wide distributed development and maintenance systems, increase our productivity and efficiency, but can also increase our vulnerabilities. Our critical infrastructures can be found in many places. Medical equipment and devices",

author = "Norm Schneidewin and Mark Montrose and Alec Feinberg and Arbi Ghazarian and Jim McLinn and Christian Hansen and Phil Laplante and Nihal Sinnadurai and Enrico Zio and Wolfgang Kr{\"o}ger and Rick Linger and Wong, {W. Eric} and Vidroha Debroy and Andrew Restrepo and Wang, {C. W.} and Shiuh-Pyng Shieh and Joseph Childs",

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Schneidewin, N, Montrose, M, Feinberg, A, Ghazarian, A, McLinn, J, Hansen, C, Laplante, P, Sinnadurai, N, Zio, E, Kröger, W, Linger, R, Wong, WE, Debroy, V, Restrepo, A, Wang, CW, Shieh, S-P & Childs, J 2010, 'IEEE reliability society technical operations annual technical report for 2010', IEEE Transactions on Reliability, vol. 59, no. 3, 5510015, pp. 449-482. https://doi.org/10.1109/TR.2010.2052190

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AU - Linger, Rick

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IEEE reliability society technical operations annual technical report for 2010

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