Identification of fault types for single faults in bitonic sorters

Tsern-Huei Lee; Jin Jye Chou

doi:10.1109/ICC.1995.525222

Identification of fault types for single faults in bitonic sorters

Tsern-Huei Lee^*, Jin Jye Chou

^*Corresponding author for this work

Department of Electrical and Computer Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.

Original language	English
Pages	516-522
Number of pages	7
DOIs	https://doi.org/10.1109/ICC.1995.525222
State	Published - 18 Jun 1995
Event	Proceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3) - Seattle, WA, USA Duration: 18 Jun 1995 → 22 Jun 1995

Conference

Conference	Proceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3)
City	Seattle, WA, USA
Period	18/06/95 → 22/06/95

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10.1109/ICC.1995.525222

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@conference{6cb5d87f89004562bbda1ec3161dbfc4,

title = "Identification of fault types for single faults in bitonic sorters",

abstract = "In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.",

author = "Tsern-Huei Lee and Chou, {Jin Jye}",

year = "1995",

month = jun,

day = "18",

doi = "10.1109/ICC.1995.525222",

language = "English",

pages = "516--522",

note = "Proceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3) ; Conference date: 18-06-1995 Through 22-06-1995",

}

TY - CONF

T1 - Identification of fault types for single faults in bitonic sorters

AU - Lee, Tsern-Huei

AU - Chou, Jin Jye

PY - 1995/6/18

Y1 - 1995/6/18

N2 - In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.

AB - In a previous paper, we presented a procedure for detecting and locating single solid logical faults in bitonic sorters. We showed that it takes at most four tests to detect a single fault and most faults need only two tests to be detected. In this paper we present a procedure for identifying the fault type, assuming the faulty component has been located. In general, in order to identify the fault type, one needs to know whether the faulty sorting element is an up sorting element or a down sorting element as well as the values of erroneous and unidentified outputs. For some sorting element faults, an additional test is required to identify the fault types.

UR - http://www.scopus.com/inward/record.url?scp=0029229402&partnerID=8YFLogxK

U2 - 10.1109/ICC.1995.525222

DO - 10.1109/ICC.1995.525222

M3 - Paper

AN - SCOPUS:0029229402

SP - 516

EP - 522

T2 - Proceedings of the 1995 IEEE International Conference on Communications. Part 1 (of 3)

Y2 - 18 June 1995 through 22 June 1995

ER -

Identification of fault types for single faults in bitonic sorters

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