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Hot-carrier injection-induced disturb and improvement methods in 3d NAND flash memory
Wei Liang Lin*, Wen Jer Tsai, C. C. Cheng, Chun Chang Lu, S. H. Ku, Y. W. Chang, Guan Wei Wu, Lenvis Liu, S. W. Hwang, Tao Cheng Lu, Kuang Chao Chen, Tseung-Yuen Tseng, Chih Yuan Lu
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
4
Scopus
citations