Highly strained InGaAs oxide confined VCSELs emitting in 1.25 μm

S. J. Chang*, Hsin-Chieh Yu, Y. K. Su, I. L. Chen, T. D. Lee, C. M. Lu, C. H. Chiou, Z. H. Lee, H. P. Yang, C. P. Sung

*Corresponding author for this work

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