High-Reliability Perovskite Quantum Dots Using Atomic Layer Deposition Passivation for Novel Photonic Applications

Tzu Yi Lee, Tsau Hua Hsieh, Wen Chien Miao, Konthoujam James Singh, Yiming Li, Chang Ching Tu, Fang Chung Chen*, Wen Chung Lu, Hao Chung Kuo*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

In this study, we propose highly stable perovskite quantum dots (PQDs) coated with Al2O3 using atomic layer deposition (ALD) passivation technology. This passivation layer effectively protects the QDs from moisture infiltration and oxidation as well as from high temperatures and any changes in the material characteristics. They exhibit excellent wavelength stability and reliability in terms of current variation tests, long-term light aging tests, and temperature/humidity tests (60°/90%). A white-light system has been fabricated by integrating a micro-LED and red phosphor exhibiting a high data transmission rate of 1 Gbit/s. These results suggest that PeQDs treated with ALD passivation protection offer promising prospects in full-color micro-displays and high-speed visible-light communication (VLC) applications.

Original languageEnglish
Article number4140
JournalNanomaterials
Volume12
Issue number23
DOIs
StatePublished - Dec 2022

Keywords

  • ALD passivation technology
  • micro-displays
  • perovskite quantum dots
  • reliability
  • VLC

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