High Performance Inversion-Mode In0.53Ga0.47As FinFETs for Logic and RF Applications

Jing Yuan Wu, Ping Huang, Quang Ho Luc, Hua Lun Ko, Yung Chun Chiang, Hsiang Chan Yu, Mu Yu Chen, Edward Yi Chang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

An inversion-mode In0.53Ga0.47As FinFET exhibiting a transition frequency (fT) of 271 GHz and a maximum oscillation frequency (fmax) of 78 GHz at Vds = 0.5 V is reported in this work. Simultaneously, the transconductance (gm) of 2056 (μS/μm) and drain induced barrier lowering (DIBL) of 121 (mV/V) obtained were also exhibited. Moreover, a subthreshold swing (SS) of 86 and 97 (mV/dec) was obtained at Vds = 0.05 and 0.5 V, respectively. These exceptional properties are the result of employing N2 remote plasma treatment, enhancing the quality of high-k/III-V interface and carrier mobility. The fin structure contributes to good suppression of short channel effects (SCEs), and the superior transfer characteristics are due to the improved gate controllability. We also extracted an effective electron velocity (νeff) of 2.18 × 107 (cm/s) by delay time analysis, providing a probable explanation for the obtained fT performance. This work explicitly exhibits the potential of high-performance inversion-mode InGaAs FinFETs, positioning them as promising candidates for future high-frequency system applications.

Original languageEnglish
Pages (from-to)445-448
Number of pages4
JournalIEEE Transactions on Nanotechnology
Volume22
DOIs
StatePublished - 2023

Keywords

  • FinFET
  • InGaAs
  • inversion channel layer
  • transition frequency

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